本文介紹了CF(Compact Flash)卡的基本結(jié)構(gòu)和工作原理。在此基礎(chǔ)上詳細(xì)的給出了在C8051F34x-DK開(kāi)發(fā)平臺(tái)上，通過(guò)串口發(fā)送ATA命令和非ATA命令來(lái)控制C8051F340單片機(jī)，對(duì)CF卡等PC卡的各項(xiàng)特征信息（如：扇區(qū)總數(shù)、柱面數(shù)、磁頭數(shù)、每磁道扇區(qū)數(shù)、序列號(hào)等）和功能（在三種模式下的CF卡8位/16位的讀，寫，連續(xù)讀，連續(xù)寫等）進(jìn)行一系列測(cè)試的一個(gè)通用測(cè)試系統(tǒng)的設(shè)計(jì)方案。文中詳細(xì)介紹了True IDE模式下寫CF卡一個(gè)扇區(qū)的具體實(shí)現(xiàn)過(guò)程，并給出了相應(yīng)的程序以及系統(tǒng)的運(yùn)行結(jié)果。
關(guān)鍵字：CF卡；C8051；串口；ATA命令；測(cè)試系統(tǒng)
Abstract: First of all, the working principle theory and operating method of CF card is introduced in this paper. On the basis of this, a generic storage test system is designed, which is intend to provide a means to functionally test a CF card，PC Card ,IDE drives or other similar storage subsystems. The test setup is based on Silicon Lab’s C8051F34x-DK
development kit. And the testing will be performed using ATA commands and non- ATA commands via the C8051F340 microcontroller. We also give the details of writing a sector of CF card in the True IDE mode. The relevant program and result is also put forward.
Key words: CF card; C8051; serial port; ATA command; test system